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Title: | Carbon-Doped Cryogel Thin Films Derived from Resorcinol Formaldehyde | Authors: | Marković, Z. Kleut, D. Babić, B. Holclajtner Antunović, Ivanka Pavlović, V. Todorović-Marković, B. |
Keywords: | Atomic force microscopy;Fourier transform infrared spectroscopy;Graphene;Graphene quantum dots;Raman spectroscopy;Resorcinol formaldehyde;Scanning electron microscopy;Single-wall carbon nanotubes;Thin films | Issue Date: | 27-Dec-2013 | Journal: | Advanced Carbon Materials and Technology | Abstract: | This chapter presents the results of structural properties of carbon-doped cryogel thin fi lms derived from resorcinol formaldehyde (RF). The RF cryogels were doped by single-wall carbon nanotubes (SWCNTs), graphene and graphene quantum dots (GQDs). Different characterization techniques were used to investigate structural properties of these fi lms: atomic force microscopy (AFM), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy. Raman spectroscopy was performed using two excitation laser energies in the visible range in order to investigate the effect of ceramic glass substrate on the Raman features of investigated carbon-doped RF cryogel thin fi lms. The particle size of these fi lms was determined by atomic force microscopy and scanning electron microscopy. |
URI: | https://dspace.ffh.bg.ac.rs/handle/123456789/1769 | ISBN: | 9781118686232 | DOI: | 10.1002/9781118895399.ch12 |
Appears in Collections: | Journal Article |
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