Environmental scanning electron microscopy study of commonly used filters substrates for the active sampling of atmospheric aerosols

Abstract

Surface topography of different kinds of commonly used atmospheric particulate matter filters has been investigated using the environmental scanning electron microscopic technique (ESEM). This new technique allows us to observe samples under controlled gaseous atmosphere without any prior preparation of the sample, i.e. coating and fixation. Herein we present comparison of topography of the most commonly used atmospheric particulate filters such as glass, nitrocellulose paper, PVC and Teflon before and after performing active sampling of atmospheric particulates.